2325389
Project Grant
Overview
Grant Description
SBIR Phase I: Controlled geometry ultrasharp nanoprobes for semiconductor diagnostics.
This Small Business Innovation Research Phase I project aims to improve a critical method called nanoprobing used to manufacture semiconductors by enabling the technique to probe smaller and more complex electrical devices for longer periods of time.
Nanoprobe instruments are used to diagnose and analyze electrical faults in the most advanced computer chips made today; without them, the manufacture of state-of-the-art advanced semiconductors would be impossible.
The improved semiconductor nanoprobes that are the focus of this project will greatly enable those who develop and apply the most advanced microelectronics for an array of products across the private commercial and federal government sectors.
These include artificial intelligence, cutting-edge electronic and quantum computing devices, advanced control systems for power generation and refrigeration, advanced weapon systems, medical diagnostics, computer controlled surgical equipment, consumer electronic devices such as computers and mobile phone technology, among others.
The commercial potential of this application will be realized via the sales of nanoprobes to fully integrated chip manufacturers, fabless semiconductor companies, and chip foundries.
Annual worldwide sales of nanoprobing instruments exceed $100 million and annual sales of nanoprobes used in those instruments exceed $25 million.
The intellectual merit of this project derives from a recent and fundamental discovery in surface science.
This breakthrough allows the application of external conditions to influence how a nanoprobe apex forms.
The innovation inherent in this project will use this discovery to develop an additive manufacturing technology to create a probe tip with new and novel properties and predetermined geometries idealized for nanoprobing from a variety of materials.
The research objective of this R&D is to explore a set of fabrication variables that will optimize both the process yield and probe tip properties.
The research of this project will entail a determination of the exact procedure and conditions to yield nanoprobes that have geometries and oxidation-resistance suitable for next-generation semiconductor technology nodes.
The anticipated technical results from this project will be advanced nanoprobes and a better understanding of how to control the surface properties of these probes.
The results will also serve as a knowledge base and platform technology to develop other tip-based applications, such as scanning probe microscopy.
This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the foundation's intellectual merit and broader impacts review criteria.
Subawards are not planned for this award.
This Small Business Innovation Research Phase I project aims to improve a critical method called nanoprobing used to manufacture semiconductors by enabling the technique to probe smaller and more complex electrical devices for longer periods of time.
Nanoprobe instruments are used to diagnose and analyze electrical faults in the most advanced computer chips made today; without them, the manufacture of state-of-the-art advanced semiconductors would be impossible.
The improved semiconductor nanoprobes that are the focus of this project will greatly enable those who develop and apply the most advanced microelectronics for an array of products across the private commercial and federal government sectors.
These include artificial intelligence, cutting-edge electronic and quantum computing devices, advanced control systems for power generation and refrigeration, advanced weapon systems, medical diagnostics, computer controlled surgical equipment, consumer electronic devices such as computers and mobile phone technology, among others.
The commercial potential of this application will be realized via the sales of nanoprobes to fully integrated chip manufacturers, fabless semiconductor companies, and chip foundries.
Annual worldwide sales of nanoprobing instruments exceed $100 million and annual sales of nanoprobes used in those instruments exceed $25 million.
The intellectual merit of this project derives from a recent and fundamental discovery in surface science.
This breakthrough allows the application of external conditions to influence how a nanoprobe apex forms.
The innovation inherent in this project will use this discovery to develop an additive manufacturing technology to create a probe tip with new and novel properties and predetermined geometries idealized for nanoprobing from a variety of materials.
The research objective of this R&D is to explore a set of fabrication variables that will optimize both the process yield and probe tip properties.
The research of this project will entail a determination of the exact procedure and conditions to yield nanoprobes that have geometries and oxidation-resistance suitable for next-generation semiconductor technology nodes.
The anticipated technical results from this project will be advanced nanoprobes and a better understanding of how to control the surface properties of these probes.
The results will also serve as a knowledge base and platform technology to develop other tip-based applications, such as scanning probe microscopy.
This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the foundation's intellectual merit and broader impacts review criteria.
Subawards are not planned for this award.
Awardee
Funding Goals
THE GOAL OF THIS FUNDING OPPORTUNITY, "NSF SMALL BUSINESS INNOVATION RESEARCH (SBIR)/ SMALL BUSINESS TECHNOLOGY TRANSFER (STTR) PROGRAMS PHASE I", IS IDENTIFIED IN THE LINK: HTTPS://WWW.NSF.GOV/PUBLICATIONS/PUB_SUMM.JSP?ODS_KEY=NSF23515
Grant Program (CFDA)
Awarding / Funding Agency
Place of Performance
West Chester,
Pennsylvania
19382-5599
United States
Geographic Scope
Single Zip Code
Tiptek was awarded
Project Grant 2325389
worth $274,995
from National Science Foundation in September 2024 with work to be completed primarily in West Chester Pennsylvania United States.
The grant
has a duration of 5 months and
was awarded through assistance program 47.084 NSF Technology, Innovation, and Partnerships.
The Project Grant was awarded through grant opportunity NSF Small Business Innovation Research / Small Business Technology Transfer Phase I Programs.
SBIR Details
Research Type
SBIR Phase I
Title
SBIR Phase I: Controlled Geometry Ultrasharp Nanoprobes for Semiconductor Diagnostics
Abstract
This Small Business Innovation Research Phase I project aims to improve a critical method called nanoprobing used to manufacture semiconductors by enabling the technique to probe smaller and more complex electrical devices for longer periods of time. Nanoprober instruments are used to diagnose and analyze electrical faults in the most advanced computer chips made today; without them, the manufacture of state-of-the-art advanced semiconductors would be impossible. The improved semiconductor nanoprobes that are the focus of this project will greatly enable those who develop and apply the most advanced microelectronics for an array of products across the private commercial and federal government sectors. These include artificial intelligence, cutting-edge electronic and quantum computing devices, advanced control systems for power generation and refrigeration, advanced weapon systems, medical diagnostics, computer controlled surgical equipment, consumer electronic devices such as computers and mobile phone technology, among others. The commercial potential of this application will be realized via the sales of nanoprobes to fully integrated chip manufacturers, fabless semiconductor companies, and chip foundries. Annual worldwide sales of nanoprobers exceed $100 million and annual sales of nanoprobes used in those instruments exceed $25 million.
The intellectual merit of this project derives from a recent and fundamental discovery in surface science. This breakthrough allows the application of external conditions to influence how a nanoprobe apex forms. The innovation inherent in this project will use this discovery to develop an additive manufacturing technology to create a probe tip with new and novel properties and predetermined geometries idealized for nanoprobing from a variety of materials. The research objective of this R&D is to explore a set of fabrication variables that will optimize both the process yield and probe tips properties. The research of this project will entail a determination of the exact procedure and conditions to yield nanoprobes that have geometries and oxidation-resistance suitable for next-generation semiconductor technology nodes. The anticipated technical results from this project will be advanced nanoprobes and a better understanding of how to control the surface properties of these probes. The results will also serve as a knowledge base and platform technology to develop other tip-based applications, such as scanning probe microscopy.
This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
Topic Code
IH
Solicitation Number
NSF 23-515
Status
(Complete)
Last Modified 9/25/24
Period of Performance
9/15/24
Start Date
2/28/25
End Date
Funding Split
$275.0K
Federal Obligation
$0.0
Non-Federal Obligation
$275.0K
Total Obligated
Activity Timeline
Additional Detail
Award ID FAIN
2325389
SAI Number
None
Award ID URI
SAI EXEMPT
Awardee Classifications
Small Business
Awarding Office
491503 TRANSLATIONAL IMPACTS
Funding Office
491503 TRANSLATIONAL IMPACTS
Awardee UEI
UL7ESCEFRW49
Awardee CAGE
6HS30
Performance District
PA-06
Senators
Robert Casey
John Fetterman
John Fetterman
Modified: 9/25/24