Xray Tomography Software

Background
The National Institute of Standards and Technology (NIST) is seeking to acquire X-ray computed tomography (XCT) simulation software as part of its CHIPS Metrology R&D program. This program focuses on nondestructive defect detection metrology (NDDM) for semiconductor advanced packaging projects.

The goal of the acquisition is to develop simulated data sets that will enhance the accuracy of XCT defect detection metrology, thereby improving efficiency and productivity in semiconductor failure analysis processes.

Work Details
The contract includes the following line items:
- CLIN 0001 – XCT Simulation Software
- Quantity: 1 Permanent License
- Technical Specifications:
- Capable of simulating various vendor’s laboratory transmission and reflection sources and geometries, with a preference for synchrotron simulation.
- Must simulate X-ray energies from 1 keV to at least 450 keV.
- Capable of simulating both monochromatic and polychromatic spectra.
- Should consider factors such as electron beam energy, anode material, thickness, angle, window material and thickness, and pre-filter in the source spectrum.
- Ability to adjust source spot size.
- Must support direct use of three-dimensional (3D) surface meshes (e.g., STL file format) for simulation and allow importing custom surface meshes.

Place of Performance
Gaithersburg MD 20899 UNITED STATES

Bidder Requirements
Offerors must demonstrate technical capability by providing documentation that shows their proposed system meets or exceeds all minimum requirements outlined in the Statement of Work. Evidence of authorization from the manufacturer to provide the software must be included.