Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD   2

Background
NIST is seeking information from sources that may be capable of providing a commercial item solution that meets or exceeds the following draft minimum specifications. NIST intends to install the analytical detectors described here on an existing NIST owned JEOL 7800 SEM in Gaithersburg MD.

Work Details
NIST is seeking Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD and EDS Detector with specific technical requirements such as energy filtering, sensitivity range, pattern resolution, motorized detector insertion and retraction, data collection software capabilities, control system specifications, and integration with JEOL 7800 SEM. Respondents are required to provide detailed information about their company, address, contact details, unique entity ID if registered in https://sam.gov, laboratory equipment that matches the specifications, performance capabilities of the equipment, potential barriers in the market research notice and draft minimum specifications, customization limits, small business status, alternative NAICS code if applicable, available services with the purchase of equipment, standard of sale offered by the company, facility renovation services related to installation of equipment, published price arrangements for equipment and services, manufacturing location details, existing Federal Supply Schedule contracts or other contracts against which NIST may place orders, customer references for similar equipment provided in the public or private sectors, and any other valuable information for NIST's market research.
Additionally, respondents can submit questions regarding the notice to the Primary Point of Contact and Secondary Point of Contact listed in the notice.

Place of Performance
Gaithersburg MD