Rapid Scanning and Feature Discrimination

a. Rapid Scanning and Feature Discrimination Research in rapid scanning of SNM surfaces is needed to image and identify down to sub-micron resolution unusual features (e.g., defects, areas of anomalous composition, or material inclusions) on samples of special nuclear material (SNM) or surrogates (e.g., cerium oxide or depleted uranium samples). Technology developed in this subtopic is of value to either (i) enable scans of surfaces (ideally 1 sq. cm area) using various microscopies (electron, optical, other) at high resolution (ideally micron or sub-micron resolution) rapidly (ideally hours or days rather than years to complete a high-resolution scan of such a large surface area), or (ii) enable scans of surfaces (ideally 1 sq. cm area) using various microscopies (electron, optical, other) at relatively low resolution rapidly, then apply algorithms to select subsample spots for micron-scale imaging. Software algorithms developed in this subtopic could be used to locate micron-sized particles of interest (e.g., dust or pollen grains) or regions of abnormality for further scrutiny and analysis. This subtopic welcomes rapid approaches that facilitate the determination of whether a single mapped square cm area is truly representative of the entire sample surface, as well as probe whether a subsample image exhibits correlated pattern templates representing the full area under investigation. Questions Contact: Timothy Ashenfelter, Timothy.Ashenfelter@nnsa.doe.gov