Methodologies to Develop Radiation Testing Environments for Survivable Microelectronics

RT&L FOCUS AREA(S): Microelectronics TECHNOLOGY AREA(S): Sensors; Electronics; Space Platform The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual use items. Offerors must disclose any proposed use of foreign nationals (FNs), their country(ies) of origin, the type of visa or work permit possessed, and the statement of work (SOW) tasks intended for accomplishment by the FN(s) in accordance with section 3.5 of the Announcement. Offerors are advised foreign nationals proposed to perform on this topic may be restricted due to the technical data under US Export Control Laws. OBJECTIVE: Develop methodologies to evaluate and distinguish between radiation effects from a persistent beta and gamma environment, and determine the circumstances where testing for one environment is sufficient to show survivability in the other, or in a combined environment. DESCRIPTION: This topic seeks innovative, cost effective, solutions for radiation testing of microelectronics. The need for testing of microelectronics in a persistent beta environment vs. a persistent gamma environment is a subject of discussion and debate within the radiation survivability community. Aspects of the discussion include the best way to generate a persistent beta environment in a ground test, the best way to generate a persistent gamma environment in a ground test, whether successful testing in one environment is sufficient to show survivability in the other, and whether combined testing in both persistent beta and gamma environments is required or whether broader combined testing involving the full environment is necessary. PHASE I: In Phase I, show feasibility of a methodology to develop test environments that will demonstrate survivability using partial vs. combined environments. Select representative electronic parts and show survivability results, either using an analytical approach or leveraging existing test data. Consider whether existing methods of generating gamma and beta environments can be used, or whether innovative approaches are needed. PHASE II: In Phase II, implement the Phase I results in a prototype test design. Demonstrate the methodology by conducting an experimental study where electronic parts are tested in partial and combined environments. Consider whether existing methods of generating gamma and beta environments can be used, or whether innovative approaches are needed. PHASE III DUAL USE APPLICATIONS: The offeror should evaluate whether these approaches can be used for commercial space applications where radiation survivability is required, in addition to military system requirements. REFERENCES: 1. Dyal, Palmer, Particle and field measurements of the Starfish diamagnetic cavity, Journal of Geophysical Research, Vol. 111, A12211, 2006. 2. Conrad, Gurtman, Kweder, Mandell, and White, Collateral Damage to Satellites from an EMP Attack, DTRA-IR-10-22, August 2010. 3. Cladis, Davidson, and Newkirk, eds, The Trapped Radiation Handbook, NDA 2534H, Washington, DC, https://apps.dtic.mil/sti/pdfs/ADA020047.pdf. 4. Wang, Y., W. Gekelman, P. Pribyl, B. Van Compernolle, and K. Papadopoulos (2016), Generation of shear Alfv n waves by repetitive electron heating, J. Geophys. Res. Space Physics, 121, 567 577, doi:10.1002/2015JA022078. 5. James R. Schwank, Marty R. Shaneyfelt, and Paul E. Dodd, Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance, IEEE Transactions on Nuclear Science, Vol. 60, No. 3, June 2013. 6. Carleston, Colestock, Cunningham, Delzanno, Dors, Holloway, Jeffrey, Lewellen, Marksteiner, Ngyuen, Reeves, and Shipman, Radiation-Belt Remediation Using Space-Based Antennas and Electron Beams, IEEE Transactions on Plasma Science, 2019, Volume 47, Issue 5.