Methodologies for Development of Radiation-Hardened Large-Format Infrared Emitter Arrays

RT&L FOCUS AREA(S): Microelectronics; Space TECHNOLOGY AREA(S): Sensors The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual use items. Offerors must disclose any proposed use of foreign nationals (FNs), their country(ies) of origin, the type of visa or work permit possessed, and the statement of work (SOW) tasks intended for accomplishment by the FN(s) in accordance with section 3.5 of the Announcement. Offerors are advised foreign nationals proposed to perform on this topic may be restricted due to the technical data under US Export Control Laws. OBJECTIVE: Develop infrared (IR) scene projector technology that is inherently radiation-hardened (rad-hard) for testing focal plane arrays in a test chamber that includes a radiation environment. DESCRIPTION: This topic seeks the development of emitter arrays able to survive and operate through space and man-made radiation environments including total ionizing dose (TID) > 300 krads (Si), with single event upsets (SEU) < 10^(-10) errors per bit-day, and immunity to single event latch-up (SEL) at linear energy transfer (LET) levels > 100 MeV cm^2 / mg. The desired scene projector technology should have sufficiently high performance in format, dynamic range, and frame-rate to exercise next generation focal plane arrays, while at the same time being survivable in a test environment that includes radiation. Sensor technologies are outpacing the ability to test them using current state-of-the-art IR scene projectors. In addition, relevant test environments include radiation effects, so an IR scene projector in a test chamber would need to be able to operate in a radiation environment, and at cryogenic temperatures. Development of a rad-hard emitter array should allow for testing of state-of-the-art focal plane arrays. In order to advance the state-of-the-art for projector technology, projector arrays in formats of 1024x1024 or greater, operating at frame rates of 500 Hz or higher, and with dynamic range of 21 bits or greater are desired. Consider whether resolution should be specified in apparent temperature, e.g. 50 mK at 300 K, rather than in bits of dynamic range. PHASE I: Demonstrate the feasibility of a scene projector that can meet the high resolution needs of today's state-of-the-art sensor formats. Consider producibility as well as performance. Also, demonstrate the feasibility of the scene projector operating in natural space and man-made radiation environments and at cryogenic temperatures. Develop a plan to mature the selected technique(s) in Phase II. PHASE II: Implement the plan developed in Phase I and demonstrate the performance and survivability of the scene projector. Characterize performance of the hardware in the radiation and cryogenic environments and assess the accuracy of the projected scenes. PHASE III DUAL USE APPLICATIONS: Refine methodology and tool developed and transition to interested platforms. Pursue commercialization for various technologies developed in the Phase II for potential commercial uses such as diverse fields including training in the use of FLIR sensor technology, computer graphics, and Microelectromechanical Systems fabrication. REFERENCES: 1. Joe LaVeigne, Greg Franks, Tom Danielson, Thermal resolution specification in infrared scene projectors, Proc. SPIE 9452, Infrared Imaging systems: Design, analysis, Modeling and Testing XXVI, 94520Y (12 May 2015); doi: 10.1117/12.2177450. ; 2. Tom Danielson, Greg Franks, Nicholas Holmes, Joe LaVeigne, Greg Matis, Steve McHugh, Dennis Norton, Tony Vengel, John Lannon, Scott Goodwin, Achieving ultra-high temperatures with a resistive emitter array, Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 98200Z (3 May 2019); doi 10.1117/12.2225856. ; 3. Dennis T. Norton Jr., Joe Laveigne, Greg Franks, Steve McHugh, Tony Vengel, Jim Oleson, Michael MacDougal, David Westerfeld, Development of a high-definition IR LED scene projector, Proc. SPIE 9280, Infrared Imaging Systems: Design, Analysis, Modeling and Testing XXVII, 98200X (3 May 2016); doi: 10.1117/12.2225852. ; 4. Recipes to build-up a rad-hard CMOS memory, Cristiano Calligaro and Umberto Gatti, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS). ; 5. Ken Label, Robert Gigliuto, Carl Szabo, Martin Carts, Matthew Kay, Timothy Sinclair, Matthew Gadlage, Adam Duncan and Dave Ingalls, Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor, Proceedings of the 2013 IEEE Nuclear and Space Radiation Effects Conference (NSREC), also published on nepp.nasa.gov: https://nepp.nasa.gov/files/24951/NSREC2013_LaBel_W40L.pdf