Advanced Sources for Single-event Effects Radiation Testing (ASSERT)

Background
The Advanced Sources for Single-event Effects Radiation Testing (ASSERT) program aims to develop new capabilities for single-event effect (SEE) testing of 3D heterogeneously integrated (3DHI) electronic components and circuits. The program's goal is to transform the current radiation-hardened electronics design and development process, resulting in the rapid deployment of next-generation electronics to space and strategic warfighters.

Work Details
The program consists of three phases: Phase 1 focuses on designing a high energy particle source for SEE testing and demonstrating its capability to meet ASSERT program requirements. Phase 2 aims to fabricate and experimentally demonstrate the source concept developed in Phase 1. Phase 3 extends correlation studies initiated in Phase 2 and culminates in a validation of the predictive SEE testing approach with demonstrations of associated carrier distributions using tuned ASSERT source parameters. Additionally, there is a supplemental testing option throughout the program to identify devices and components critical to future space and strategic missions.

Period of Performance
The total period of performance is 54 months, organized into three phases: 18-month Phase 1, 24-month Phase 2, and 12-month Phase 3.

Place of Performance
The geographic locations for meetings include Washington, D.C. area, Los Angeles, CA area, and other relevant technical conferences.