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Ion-Tof Technologies

UEI: JJRNMCM2NNH4

Overview

Awardee Type
Parent (1 child)
Company Description
IONTOF USA: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis
Name
Ion-Tof Technologies
Headquarters
Spring Valley, NY
United States
Federal contract recipient ION-TOF USA, INC. dba ION-TOF USA INC (UEI JJRNMCM2NNH4) is headquartered in Spring Valley NY. Its primary registered NAICS is 334516 Analytical Laboratory Instrument Manufacturing. The corporation was founded in December 2000 and federally registered in March 2004.

Federal Award Analysis

Ion-Tof Technologies federal award history

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Federal Registration and Certifications

Legal Name
ION-TOF USA, INC.
DBA
ION-TOF USA INC
UEI
J9NEXRVCJNM6
CAGE Code
3SLG5
SBA Certifications
None
Self Certifications
None
Entity Structure
Corporate Entity (Not Tax Exempt)

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Contract Awards

Ion-Tof Technologies prime contract awards